LCR-T4 ESR Meter, Transistor Capacitor Tester, Electronic Component Tester, Transistor Tester Diodes Triodes Capacitance ESR Meter Automatic Tester Detector-Fast Shipping

Description

Main Function The display uses LCD (128×64 characters) to measure the gate threshold voltage and gate capacity of the MOSFET. Automatic detection of NPN and PNP transistors, N-channel and P-channel MOSFETs, diodes (including dual diodes), thyristors, triodes, resistors and capacitors. Below, the magnification and base of the triode, the MOSFET protective diode, etc., can be detected, and the forward voltage of the emitter triode can be determined.

Energy saving: the shutdown current is only 20nA and supports battery operation. Automatic shut-off to avoid unnecessary waste, save battery energy and improve battery life.

Features: Use ATmega8, ATmega168 or microcontroller. Automatically detects pin layout. The test time is about two seconds, and only capacitance and inductance measurements take a long time. (Apart from the larger capacity, the measurement of the large capacity takes a long time, a measurement time of 1 minute is normal).

Note: If the test current exceeds the holding current, SCR and Triac can be detected. However, some semiconductor thyristors and triacs have higher trigger currents than the tester can deliver. The available test current is only approx. 6 mA. Note that all functions are only used for microcontrollers with more program memory, such as ATmega168

Powerful function: supports two resistance measurements and symbol display, high four digits and unit display. A capacitor can be detected and measured. It can be used to measure the equivalent series resistance capacitance (ESR) of capacitors above 2UF. It is possible to display signs for the correct direction for two diodes. Zener diodes can be detected.